Keysight E6835A TD-SCDMA Cal Application for the E6601A Wireless Communications Test Set

Характеристики - Keysight E6835A TD-SCDMA Cal Application for the E6601A Wireless Communications Test Set

Ключевые возможности и технические характеристикиThis product will be discontinued with a last order date of October 31, 2011. It will be replaced by the E1969A, one of the E5515C applications.Features

• TD-SCDMA ARB source for flexible phone receiver (RSSI) testing
• High-speed transmitter measurements support all TD-SCDMA chipset calibration
• Dynamic power provides fast series of power measurements for high-speed amplitude characterization (requires chipset support)

Accuracy

• Channel power measurement < ±0.65 dB (< ±0.3 dB typical)
• Adjacent channel leakage ratio (ACLR) measurement±1.6 MHz offsets: < ±0.8 dB (< ±0.4 dB typical) at -33 dBc±3.2 MHz offsets: < ±0.8 dB (< ±0.4 dB typical) at -43 dBc

Dynamic Range

• Channel power measurement -65 to +28 dBm

ОписаниеThe Keysight E6835A TD-SCDMA calibration application for the Keysight E6601A Wireless Communications Test Set provides all the necessary capabilities to calibrate your TD-SCDMA mobile devices. This calibration application, designed for non-signaling test in high-volume manufacturing, helps you achieve your time-to-market goals while lowering your cost of test for TD-SCDMA wireless devices.The E6835A TD-SCDMA test solution is based on the new, next-generation, high-performance E6601A test set. You gain the benefits of industry leading measurement speed, optional time-based and portable licensing, and an integrated open Windows® PC. With applications focused on calibration, flexible licensing, a built-in PC, and high-speed measurements, the multi-format test capabilities of the E6601A offers a TD-SCDMA/GSM calibration solution that can increase your throughput and reduce your test costs.

• ARB source for flexible phone receiver (RSSI) testing
• High-speed transmitter measurements:- Mean power and RRC-filtered power- Adjacent channel leakage ratio- Spectrum emission mask- Error vector maginitude- Frequency error- Peak code domain error
• Dynamic power for fast series of power measurements
• High-performance spectrum monitor- Spectral analysis in a Windows interface

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