R&S®FSV-K40 Phase Noise Measurements
В продаже Анализаторы R&S®FSV-K40 Phase Noise Measurements оптом и в розницу. Нашли дешевле? Предоставьте свою цену, Мы сформируем более выгодное предложение. При заказе от 3000р., доставка по Самаре - БЕСПЛАТНО! Возможна отправка товара в любую точку РФ транспортной компанией.
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Технические характеристики
Характеристики - R&S®FSV-K40 Phase Noise Measurements
Key Facts- Phase noise is an important parameter in wireless communications systems. The R&S®FSV-K40 option enables the R&S®FSV and R&S®FSVA to perform fast and easy phase noise measurements in development and production. Equipped with the R&S®FSV-K40 option, the R&S®FSV and R&S®FSVA can measure the single sideband phase noise across a selectable carrier offset frequency range with logarithmic display of the offset range. Based on the measured phase noise, the user can also determine the residual FM/PM and the jitter.
- Phase noise measurement
- Carrier offset frequency range selectable from 1 Hz to 1 GHz in 1/3/10 sequence (1 Hz, 3 Hz, 10 Hz, 30 Hz, etc.)
- Number of averages, sweep mode and filter bandwidth for every measurement subrange can be individually selected to optimize the measurement speed
- Fast results for the subranges are obtained by starting the measurement at the maximum carrier offset
- Verification of carrier frequency and power prior to each measurement avoids incorrect measurements
- Improvement of dynamic range by measuring the inherent thermal noise in a reference trace and performing noise correction
- Measurement of residual FM/PM and jitter
- Integration across the entire selected carrier offset frequency range or across a separately selectable frequency range
- Tabular display of residual FM, residual PM and RMS jitter in addition to measurement trace
- Evaluation aids
- Limit lines with PASS/FAIL indication
- Spot phase noise at up to four selectable frequency offsets
- Maximum of four additional markers